Microscopy & Spatial Scale
Scale Bar & Distance Measuring Tool
Calibrate physical length scales across SEM microscopy, metallurgical grain micrographs, satellite imagery, and technical schematics.
graph.pngXY Scatter
✨ Auto-detected Bar & Column Chart — Shifted Section
Canvas WorkspaceReady
X-Axis Range
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Y-Axis Range
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Scale Type
Series Filter
Digitized Data
Real-Time Sync| # | X Value | Y Value | Delete |
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Click to edit inline
Points0
X-Mean0.0
Y-Peak0.0
Micron & Nanometer Scales
Calibrate pixels-per-micron ratios using standard SEM and TEM reference bars.
Multi-Segment Lengths
Measure multi-point polyline lengths, particle diameters, and grain boundary aspect ratios.
Angle & Area Measurements
Calculate polygon surface areas and vertex angles with calibrated physical units.